The VI measurement instrument is used to test and diagnose faulty components by measuring in-circuit signatures. 3D scans of the components are completed during this process so that a snapshot of the current/voltage characteristic can be determined at a fixed frequency.
A three-dimensional characteristic curve is also recorded with a variable frequency as the Z-axis. The measurement instrument thus enables integrated circuits (IC) to be measured virtually, creating a pin-to-pin measurement at the same time. Frequency-dependent components are thus scanned across a large range and an IC can be recorded in all variables within seconds. All of the characteristic curves are saved during this process and can be called up again for subsequent test sequences.
For the purpose of quality assurance, test flows are programmed for the modules so that consistent quality can be guaranteed when troubleshooting and resolving faults for our customers.